MicroSense and Capres joined forces as KLA companies.

MicroSense VSMs are sensitive, fast and offer the widest range of options of resistive magnet VSMs. MicroSense also offers a range of non-contact, full wafer or disk R&D and production metrology systems for MRAM, hard disk, recording head and sensor manufacturing.

CAPRES' unique microprobe and tool technology is ideal for R&D as well as production QC, it enables direct measurements of Sheet Resistance, Hall Mobility, and Active Carrier Density on conducting films down to a few nm directly on wafers up to 300 mm.

Our unique CIPTech®, PKMRAM® and KerrMapper® systems are the tools of choice for characterizing magnetic films in the MRAM, Read Head and Magnetic Sensor industry.

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