KLA
Exhibitors
MicroSense and Capres joined forces as KLA companies. MicroSense sensitive and fast VSMs offer the widest range of options of resistive magnet VSMs. MicroSense also offers non-contact, wafer or disk metrology systems for MRAM, hard disk, head and sensor manufacturing and R&D. CAPRES’ unique microprobe and tool technology enables direct measurements of Sheet Resistance, Hall Mobility, and Active Carrier Density on thin films, on wafers up to 300 mm for R&D and production QC. Our unique CIPTech®, PKMRAM® and KerrMapper® systems are the tools of choice for characterizing magnetic films in the MRAM, Read Head and Magnetic Sensor industry.